S. Mehta

发表

T. Standaert, D. Edelstein, R. Johnson, 2020, 2020 IEEE International Electron Devices Meeting (IEDM).

M. Vinet, T. Skotnicki, L. Grenouillet, 2011, 2011 Symposium on VLSI Technology - Digest of Technical Papers.

B. Haran, N. Loubet, Chanro Park, 2020, IEEE Transactions on Electron Devices.

R. G. Southwick, J. Stathis, E. Wu, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

M. Wang, T. Yamashita, H. Bu, 2016, 2016 IEEE International Electron Devices Meeting (IEDM).

R. G. Southwick, T. Yamashita, J. Stathis, 2014, 2014 IEEE International Reliability Physics Symposium.