I. Tovena

发表

Surface particulate contamination of the LIL optical components and their evolution under laser irradiation

T. Donval, J. L. Rullier, S. Palmier, 2007, SPIE Laser Damage.

Characterization of particle contamination for optical application

S. Palmier, I. Tovena, S. Garcia, 2006, SPIE Photonics Europe.

Impact of organic contamination on 1064-nm laser-induced damage threshold of dielectric mirrors

Philippe Bouchut, I. Tovena, S. Becker, 2007, SPIE Laser Damage.

Impact of outgassing organic contamination on laser-induced damage threshold of optics: effect of laser conditioning

I. Tovena, A. Pereira, M. Veillerot, 2005, SPIE Laser Damage.

Evaluation of the airborne molecular contamination inside the LIL

I. Tovena, Marc Veillerot, M. Veillerot, 2006 .