P. D. Kirsch
发表
D-H Kim,
J. A. del Alamo,
T-W Kim,
2014,
2014 IEEE International Electron Devices Meeting.
R. Jammy,
P. D. Kirsch,
L. Smith,
2011,
Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.
G. Bersuker,
P. D. Kirsch,
K. Matthews,
2014,
IEEE Transactions on Device and Materials Reliability.
T. Ngai,
G. Bersuker,
R. Jammy,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
G. Bersuker,
P. D. Kirsch,
D. C. Gilmer,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
R. Jammy,
P. D. Kirsch,
I. Ok,
2010,
2010 Symposium on VLSI Technology.
L. Larcher,
M. Nafria,
M. Porti,
2010,
2010 International Electron Devices Meeting.
S. Koveshnikov,
R. Jammy,
P. D. Kirsch,
2012,
2012 International Electron Devices Meeting.
S. Koveshnikov,
Y. Nishi,
G. Bersuker,
2012,
2012 4th IEEE International Memory Workshop.
Y. Nishi,
G. Bersuker,
R. Jammy,
2012,
2012 4th IEEE International Memory Workshop.
P. D. Kirsch,
K. Matthews,
D.-H Kim,
2013,
2013 IEEE International Electron Devices Meeting.
T. Michalak,
G. Bersuker,
P. D. Kirsch,
2013,
2013 IEEE International Electron Devices Meeting.
P. D. Kirsch,
P. Kirsch,
J. Ekerdt,
2001
.
G. Bersuker,
R. Jammy,
P. D. Kirsch,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
R. Jammy,
J. Snow,
P. D. Kirsch,
2012,
2012 12th International Workshop on Junction Technology.
G. Bersuker,
P. D. Kirsch,
K. Matthews,
2013,
IEEE Transactions on Device and Materials Reliability.
L. Larcher,
T. Ngai,
G. Bersuker,
2012,
2012 IEEE International Reliability Physics Symposium (IRPS).
R. Jammy,
P. D. Kirsch,
P. Majhi,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
P. Y. Hung,
R. Jammy,
P. D. Kirsch,
2011,
2011 International Semiconductor Device Research Symposium (ISDRS).
R. Jammy,
P. D. Kirsch,
K. Matthews,
2012,
2012 International Electron Devices Meeting.
A. S. Oates,
G. Bersuker,
P. D. Kirsch,
2014,
2014 IEEE International Reliability Physics Symposium.
S. Koveshnikov,
Y. Nishi,
G. Bersuker,
2011,
2011 IEEE International Integrated Reliability Workshop Final Report.