Eric Strid

Planar Impedance Standards and Accuracy Considerations in Vector Network Analysis

Eric Strid, 1986, 27th ARFTG Conference Digest.

Evaluation of TSV and micro-bump probing for wide I/O testing

Erik Jan Marinissen, Eric Strid, Ken Smith, 2011, 2011 IEEE International Test Conference.

A Membrane Probe for Testing High Power Amplifiers at mm-Wave Frequencies

Eric Strid, Saswata Basu, Pat Nussbaumer, 1997, 1997 27th European Microwave Conference.

LRM and LRRM Calibrations with Automatic Determination of Load Inductance

Keith Jones, Eric Strid, Andrew Davidson, 1990, 36th ARFTG Conference Digest.

RePeatability and Verification of On-Wafer Noise Parameter Measurements

Eric Strid, Arthur Fraser, Bernie Leake, 1998 .

A History of Microwave Wafer Probing

Eric Strid, 1997, 50th ARFTG Conference Digest.

Impedance Matching Probes for Wireless Applications

Eric Strid, Saswata Basu, Mike Fennelly, 1995, 46th ARFTG Conference Digest.

"On-wafer Testing Issues for the 90's and Beyond."

Mike Golio, Eric Strid, Doug Dunn, 1991, 38th ARFTG Conference Digest.