Oscar H. Gonzalez

Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications

F. Guarín, A. Dixit, S. K. Singh, 2022, 2022 IEEE International Reliability Physics Symposium (IRPS).

RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications

F. Guarín, A. Dixit, Aarti Rathi, 2022, IEEE International Reliability Physics Symposium.

Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications

A. Dixit, Sumreti Gupta, Asif Amin, 2023, IEEE Transactions on Device and Materials Reliability.

Flicker Noise (1/f) in 45-nm PDSOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications

A. Dixit, Sumreti Gupta, Oscar H. Gonzalez, 2024, IEEE Journal of the Electron Devices Society.