M. Schulten

A Deep Study of Resistance Switching Phenomena in TaOx ReRAM Cells: System‐Theoretic Dynamic Route Map Analysis and Experimental Verification

S. Menzel, A. Ascoli, A. Siemon, 2022, Advanced Electronic Materials.

On the origin of the fading memory effect in ReRAMs

Ronald Tetzlaff, Anne Siemon, Stephan Menzel, 2017, 2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS).

Theory and experimental verification of configurable computing with stochastic memristors

S. Menzel, R. Waser, K. Salama, 2021, Scientific Reports.