T. Beauchêne

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

Philippe Perdu, Dean Lewis, David Trémouilles, 2003, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

A physical approach on SCOBIC investigation in VLSI

Philippe Perdu, Dean Lewis, Yves Danto, 2003, Microelectron. Reliab..

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

Hervé Lapuyade, André Touboul, Philippe Perdu, 2001, Microelectron. Reliab..