R.A. Weller

Assessing Alpha Particle-Induced Single Event Transient Vulnerability in a 90-nm CMOS Technology

B. Narasimham, R.A. Reed, B.L. Bhuva, 2008, IEEE Electron Device Letters.

Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools

R.A. Reed, R.D. Schrimpf, L.W. Massengill, 2007, IEEE Electron Device Letters.

Single-Event Effects on Combinational Logic Circuits Operating at Ultra-Low Power

B. Narasimham, R.A. Reed, B.L. Bhuva, 2008, IEEE Transactions on Nuclear Science.

Heavy Ion Testing and Single Event Upset Rate Prediction Considerations for a DICE Flip-Flop

R.A. Reed, R.D. Schrimpf, L.W. Massengill, 2009, IEEE Transactions on Nuclear Science.

General Framework for Single Event Effects Rate Prediction in Microelectronics

R.A. Reed, R.D. Schrimpf, L.W. Massengill, 2009, IEEE Transactions on Nuclear Science.

Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

R.A. Reed, R.D. Schrimpf, L.W. Massengill, 2008, IEEE Transactions on Nuclear Science.