F. Driussi

发表

M.J. van Duuren, D. Esseni, L. Selmi, 2004, Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).

O. Badami, D. Lizzit, D. Esseni, 2018, 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM).

M.J. van Duuren, L. Selmi, F. Driussi, 2006, 2006 IEEE International Conference on Microelectronic Test Structures.

D. Esseni, L. Selmi, F. Driussi, 2004, IEEE Transactions on Device and Materials Reliability.

O. Badami, D. Lizzit, D. Esseni, 2018, IEEE Transactions on Electron Devices.

P. Palestri, L. Selmi, F. Driussi, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..

G. Reimbold, D. Lafond, E. Vianello, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

E. Vianello, G. Molas, L. Perniola, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).

D. Esseni, L. Selmi, F. Piazza, 2000, International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138).

M.J. van Duuren, D. Esseni, L. Selmi, 2006, 2006 International Electron Devices Meeting.

E. Vianello, D. Esseni, P. Palestri, 2008, ESSDERC 2008 - 38th European Solid-State Device Research Conference.

D. Esseni, L. Selmi, F. Piazza, 2000, 30th European Solid-State Device Research Conference.

M.J. van Duuren, D. Esseni, L. Selmi, 2007, ESSDERC 2007 - 37th European Solid State Device Research Conference.

M.J. van Duuren, E. Vianello, D. Esseni, 2008, IEEE Transactions on Electron Devices.

D. Esseni, F. Driussi, M. De Michielis, 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..