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Dependence of beam broadening on detection angle in scanning transmission electron microtomography.

H. Jinnai, H. Nishioka, T. Kaneko, 2010, Journal of electron microscopy.

Nanoanalysis by a high‐resolution energy filtering transmission electron microscope

Y. Bando, D. Golberg, M. Mitome, 2004, Microscopy research and technique (Print).

New 300 kV Energy-Filtering Field Emission Electron Microscope

Y. Bando, D. Golberg, M. Mitome, 2001 .