Andrea Cester

发表

Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure

Gaudenzio Meneghesso, Daniel Donoval, Jaroslav Kovác, 2012, Microelectron. Reliab..

Effects of constant voltage and constant current stress in PCBM: P3HT solar cells

Marco Barbato, Nicola Wrachien, Andrea Cester, 2015, Microelectron. Reliab..

Comparison between positive and negative constant current stress on dye-sensitized solar cells

Gaudenzio Meneghesso, Andrea Reale, Aldo Di Carlo, 2013, Microelectron. Reliab..

Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress

Alessandro Paccagnella, G. Ghidini, Alessio Griffoni, 2006, Microelectron. Reliab..

Flexible and Organic Neural Interfaces: A Review

Andrea Cester, Nicolò Lago, A. Cester, 2017 .

Stress-induced instabilities of shunt paths in high efficiency MWT solar cells

Gaudenzio Meneghesso, Enrico Zanoni, Giovanna Mura, 2015, 2015 IEEE International Reliability Physics Symposium.

Effects of stair case gate bias stress in IGZO/Al2O3 flexible TFTs

G. Cantarella, Nicola Wrachien, Andrea Cester, 2018, Microelectron. Reliab..

Reliability study of organic complementary logic inverters using constant voltage stress

Gaudenzio Meneghesso, Michele Muccini, Nicola Wrachien, 2015 .

Ionising radiation effects on MOSFET drain current

Alessandro Paccagnella, G. Ghidini, Andrea Cester, 2003, Microelectron. Reliab..

Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states

Gaudenzio Meneghesso, Michele Muccini, Nicola Wrachien, 2014, Microelectron. Reliab..

Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects

Gaudenzio Meneghesso, Andrea Reale, Aldo Di Carlo, 2015, 2015 IEEE International Reliability Physics Symposium.

Characterization of high-voltage charge-trapping effects in GaN-based power HEMTs

Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Collapse of MOSFET drain current after soft breakdown

G. Guegan, S. Deleonibus, Gabriella Ghidini, 2004 .

Organic substrates for novel printed sensors in neural interfacing: a measurement method for cytocompatibility analysis

Giada Giorgi, Sarah Tonello, Andrea Cester, 2020, 2020 IEEE International Symposium on Medical Measurements and Applications (MeMeA).

Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics

Gaudenzio Meneghesso, Michele Muccini, Andrea Stefani, 2015, Microelectron. Reliab..

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

Montserrat Nafría, Javier Martín-Martínez, Xavier Aymerich, 2007, Microelectron. Reliab..

Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED

Gaudenzio Meneghesso, Nicola Wrachien, D. Bari, 2010, Microelectron. Reliab..

Thermal and electrical investigation of the reverse bias degradation of silicon solar cells

Gaudenzio Meneghesso, Enrico Zanoni, Massimo Vanzi, 2013, Microelectron. Reliab..

Reliability of capacitive RF MEMS switches subjected to repetitive impact cycles at different temperatures

Giorgio De Pasquale, Aurelio Somà, Gaudenzio Meneghesso, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Reliability study of dye-sensitized solar cells by means of solar simulator and white LED

Gaudenzio Meneghesso, Andrea Reale, Aldo Di Carlo, 2012, Microelectron. Reliab..

Simultaneous stimulation and recording of cell activity with reference-less sensors: Is it feasible?

Morten Gram Pedersen, Nicola Wrachien, Andrea Cester, 2018, Organic Electronics.

Analysis of the effects of voltage pulses on P3HT: PCBM polymeric solar cells by means of TLP technique

Marco Barbato, Nicola Wrachien, Andrea Cester, 2018, Microelectron. Reliab..

Worldwide outdoor round robin study of organic photovoltaic devices and modules

Suren A. Gevorgyan, Yulia Galagan, James C. Blakesley, 2014 .

Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs)

Gaudenzio Meneghesso, Andrea Reale, Aldo Di Carlo, 2011, Microelectron. Reliab..

Effects of constant voltage stress on organic complementary logic inverters

Gaudenzio Meneghesso, Michele Muccini, Andrea Stefani, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Ionising radiation and electrical stress on nanocrystal memory cell array

Alessandro Paccagnella, Nicola Wrachien, Andrea Cester, 2007, Microelectron. Reliab..

Effects of constant voltage stress on p- and n-type organic thin film transistors with poly(methyl methacrylate) gate dielectric

Gaudenzio Meneghesso, Michele Muccini, Raffaella Capelli, 2013, Microelectron. Reliab..

RL-EGOFET cell biosensors: A novel approach for the detection of action potentials

Sarah Tonello, Andrea Cester, G. Giorgi, 2021, 2021 IEEE International Symposium on Medical Measurements and Applications (MeMeA).

On the Pulsed and Transient Characterization of Organic Field-Effect Transistors

Gaudenzio Meneghesso, Stefano Toffanin, Michele Muccini, 2015, IEEE Electron Device Letters.

Wear-out and breakdown of ultra-thin gate oxides after irradiation

Andrea Cester, 2002 .

Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides

Alessandro Paccagnella, A. Scarpa, Gabriella Ghidini, 1999 .

Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides

Alessandro Paccagnella, A. Scarpa, Gabriella Ghidini, 1998 .

Stochastic modeling of progressive breakdown in ultrathin SiO2 films

Alessandro Paccagnella, Enrique Miranda, Andrea Cester, 2003 .

Accelerated wear-out of ultra-thin gate oxides after irradiation

Alessandro Paccagnella, Gerard Ghibaudo, Gabriella Ghidini, 2003 .

Soft breakdown current noise in ultra-thin gate oxides

Alessandro Paccagnella, Gabriella Ghidini, Andrea Cester, 2002 .

Effects of current stress and thermal storage on polymeric heterojunction P3HT:PCBM solar cell

Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Logistic model for leakage current in electrical stressed ultra-thin gate oxides

A. Paccagnella, Enrique Miranda, Andrea Cester, 2003 .

Noise characteristics of radiation-induced soft breakdown current in ultrathin gate oxides

Gabriella Ghidini, A. Paccagnella, Andrea Cester, 2001 .

A Combined Mechanical and Electrical Characterization Procedure for Investigating the Dynamic Behavior of RF-MEMS Switches

Gaudenzio Meneghesso, Marco Barbato, Andrea Cester, 2014, IEEE Transactions on Device and Materials Reliability.

Ionizing radiation effects on ultra-thin oxide MOS structures

Alessandro Paccagnella, Andrea Cester, 2004 .

TIPS-Pentacene as Biocompatible Material for Solution Processed High-Performance Electronics Operating in Water

Nicola Wrachien, Andrea Cester, Marco Buonomo, 2018, IEEE Electron Device Letters.

Detrended fluctuation analysis of the soft breakdown current

Alessandro Paccagnella, Gabriella Ghidini, Andrea Cester, 2001 .

MOSFET drain current reduction under Fowler–Nordheim and channel hot carrier injection before gate oxide breakdown

Alessandro Paccagnella, Gabriella Ghidini, Simone Gerardin, 2004 .

Role of buffer doping and pre-existing trap states in the current collapse and degradation of AlGaN/GaN HEMTs

Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni, 2014, 2014 IEEE International Reliability Physics Symposium.

Model of Organic Solar Cell Photocurrent Including the Effect of Charge Accumulation at Interfaces and Non-Uniform Carrier Generation

Antonio Rizzo, Suren A. Gevorgyan, Frederik C. Krebs, 2016, IEEE Journal of the Electron Devices Society.

Trapping phenomena in AlGaN/GaN HEMTs: a study based on pulsed and transient measurements

Gaudenzio Meneghesso, Enrico Zanoni, Umesh K. Mishra, 2013 .

Post-radiation-induced soft breakdown conduction properties as a function of temperature

Jordi Suñé, Alessandro Paccagnella, Enrique Miranda, 2001 .

Stress induced leakage current under pulsed voltage stress

Alessandro Paccagnella, G. Ghidini, Andrea Cester, 2000 .

Preconditioning Procedure for the Better Estimation of the Long-Term Lifetime in Microelectromechanical Switches

Gaudenzio Meneghesso, Benno Margesin, Marco Barbato, 2016, IEEE Transactions on Electron Devices.

From Radiation Induced Leakage Current to Soft Breakdown in Irradiated MOS Devices With Ultrathin Gate Oxide

Alessandro Paccagnella, Gabriella Ghidini, Andrea Cester, 1999 .

Thermal and electrical characterization of catastrophic degradation of silicon solar cells submitted to reverse current stress

Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, 2013, 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).

Systematic characterization of soft- and hard-breakdown spots using techniques with nanometer resolution

Marc Porti, Alessandro Paccagnella, Simone Gerardin, 2007 .