J. A. Gracio

Test preparation and fault analysis using a bottom-up methodology

J. P. Teixeira, J. A. Gracio, P. A. Bicudo, 1989, [1989] Proceedings of the 1st European Test Conference.

Bottom-up methodology for test preparation and refinement

J. A. Gracio, P. A. Bicudo, N. N. Rua, 1989, IEEE International Symposium on Circuits and Systems,.

Bottom-up testing methodology for VLSI

Arlindo L. Oliveira, J. A. Gracio, P. A. Bicudo, 1988, Proceedings of the IEEE 1988 Custom Integrated Circuits Conference.