John Slagter

Self-Supervised Single-Image Depth Estimation From Focus and Defocus Clues

G. Lu, Yawen Lu, Garrett Milliron, 2021, IEEE Robotics and Automation Letters.

Optical measure of disorder: Why Urbach analysis works for amorphous silicon but fails for amorphous carbon

D. Tsu, T. Schuelke, John Slagter, 2020 .

Quantification of diffuse scattering in glass and polymers by parametric power law analysis of UV to NIR light

D. Tsu, T. Schuelke, M. Muehle, 2017 .