O. Moutanabbir

Micrometer-thick, atomically random SiGeSn for silicon-integrated infrared optoelectronics

Leduc, Arunandan Kumar, S. Assali, 2021 .

Cu diffusion-induced vacancy-like defects in freestanding GaN

C. Hagendorf, R. Krause-Rehberg, W. Anwand, 2011 .

Etching‐back of uniaxially strained silicon on insulator investigated by spectroscopic ellipsometry

M. Reiche, R. Scholz, S. Christiansen, 2008 .

The Phenomenology of Ion Implantation-Induced Blistering and Thin-Layer Splitting in Compound Semiconductors

U. Gösele, O. Moutanabbir, S. Christiansen, 2010 .

Strained Silicon Devices

M. Reiche, M. Horstmann, S. Flachowsky, 2009 .