S. Kim

发表

Hae-Doo Park, Dong-Il Lee, Suk-Gyu Lee, 2002 .

D. Byun, Dong-Yurl Yu, Junghwan Bang, 2023, Microelectronics Reliability.

D. Byun, Dong-Yurl Yu, Junghwan Bang, 2023, Journal of Materials Science: Materials in Electronics.