R. Ross

The Role of a Physical Analysis Laboratory in a 300 mm IC Development and Manufacturing Centre

D. Delille, L.F.Tz. Kwakman, N. Bicais‐Lepinay, 2005 .

The new FISMA standards and guidelines changing the dynamic of information security for the federal government

R. Ross, S. Katzke, P. Toth, 2004, MILCOM 2005 - 2005 IEEE Military Communications Conference.

A comprehensive sequential yield analysis methodology and the financial payback for higher yields

J. Bailey, R. Ross, N. Atchison, 1999, 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295).

Wafer zone based yield analysis

R. Ross, N. Atchison, 1997, 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023).