Koji Asami
发表
Haruo Kobayashi,
Koji Asami,
Takahide Suzuki,
2009
.
Haruo Kobayashi,
Tsuyoshi Kurosawa,
Hiroyuki Miyajima,
2010,
2010 IEEE International Test Conference.
Toshiaki Kurihara,
Koji Asami,
Yushi Inada,
2010,
2010 IEEE International Test Conference.
Haruo Kobayashi,
Tsuyoshi Kurosawa,
Hiroyuki Miyajima,
2011,
2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop.
Tomonori Yanagida,
Shohei Shibuya,
Haruo Kobayashi,
2016,
2016 IEEE 25th Asian Test Symposium (ATS).
Koji Asami,
1996,
Proceedings International Test Conference 1996. Test and Design Validity.
Tomonori Yanagida,
Shohei Shibuya,
Kosuke Machida,
2018,
2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Shohei Shibuya,
Haruo Kobayashi,
Takuya Arafune,
2017,
2017 International Symposium on Intelligent Signal Processing and Communication Systems (ISPACS).
Koji Asami,
Michiaki Arai,
2009,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Tomonori Yanagida,
Shohei Shibuya,
Haruo Kobayashi,
2017,
2017 International Test Conference in Asia (ITC-Asia).
Koji Asami,
2005,
IEEE International Conference on Test, 2005..
Takayuki Nakamura,
Koji Asami,
2016,
2016 IEEE International Test Conference (ITC).
Yoichi Maeda,
Kazumi Hatayama,
Haruo Kobayashi,
2018,
2018 IEEE 36th VLSI Test Symposium (VTS).
Koji Asami,
Shinsuke Tajiri,
1999,
International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
Tetsuya Iizuka,
Takahiro J. Yamaguchi,
Takahiro Yamaguchi,
2020,
IEEE Transactions on Circuits and Systems I: Regular Papers.
Haruo Kobayashi,
Tomonori Yanagida,
Shohei Shibuya,
2018,
2018 IEEE International Test Conference in Asia (ITC-Asia).
Haruo Kobayashi,
Minghui Wu,
Isao Shimizu,
2013,
2013 22nd Asian Test Symposium.
Koji Asami,
2007,
IEICE Trans. Fundam. Electron. Commun. Comput. Sci..
Tomonori Yanagida,
Shohei Shibuya,
Haruo Kobayashi,
2016,
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Haruo Kobayashi,
Ryo Sekiyama,
Shu Sasaki,
2019
.
Koji Asami,
Koji Asami,
2007,
2007 IEEE International Test Conference.
Haruo Kobayashi,
Hidetaka Suzuki,
Hiroyuki Miyajima,
2008,
2008 17th Asian Test Symposium.
Haruo Kobayashi,
Satoshi Uemori,
Satoshi Ito,
2010
.
Toshifumi Watanabe,
Yasuo Furukawa,
Koji Asami,
2002,
Proceedings. International Test Conference.
Takashi Shimura,
Toshiaki Kurihara,
Koji Asami,
2013,
2013 IEEE 31st VLSI Test Symposium (VTS).
Haruo Kobayashi,
Tomonori Yanagida,
Shohei Shibuya,
2019
.
Haruo Kobayashi,
Anna Kuwana,
Masahiro Ishida,
2021,
2021 IEEE 30th Asian Test Symposium (ATS).
Masahiro Fujita,
Tetsuya Iizuka,
Takahiro J. Yamaguchi,
2021,
IEEE Transactions on Circuits and Systems I: Regular Papers.
Haruo Kobayashi,
Ryo Sekiyama,
Koji Asami,
2016,
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).