M. K. Shih

Experimental method and FE simulation model for evaluation of wafer probing parameters

D. S. Liu, M. K. Shih, 2006, Microelectron. J..

Measurement and analysis of contact resistance in wafer probe testing

W. H. Huang, D. S. Liu, M. K. Shih, 2007, Microelectron. Reliab..

Experimental aided performance evaluation methods for wafer probe test

De-Shin Liu, M. K. Shih, S. M. Liu, 2006 .