C. Granger

Experimental characterization of the constitutive materials of MgB2 multi-filamentary wires for the development of 3D numerical models

C. Bruzek, A. Badel, P. Tixador, 2017 .

High precision measurements of arsenic and phosphorous implantation dose in silicon by secondary ion mass spectrometry

J. M. Mckinley, P. Chi, D. Simons, 2002 .

Boron pileup and clustering in silicon-on-insulator films

D. Monroe, H. Gossmann, D. Jacobson, 1999 .

Analysis of alkali elements in insulators using a CAMECA IMS-6f

F. Stevie, C. Granger, J. Mckinley, 2000 .

Depth profiling of ultra-shallow implants using a Cameca IMS-6f

J. J. Lee, F. Stevie, D. Sieloff, 2000 .