Alex See

Ultrashallow depth profiling of B deltas in Si using a CAMECA IMS 6f

Andrew T. S. Wee, C. H. Alfred Huan, Chee Mang Ng, 2000, Other Conferences.

Effect of deposition conditions on the properties of HDP-CVD-fluorinated silicon oxide (SiOF)

Alex See, John Sudijono, Young Way Teh, 2000, Other Conferences.

Near-field Raman imaging using optically trapped dielectric microsphere.

Alex See, Johnson Kasim, A. See, 2008, Optics express.

Suppressed crystallization of Hf-based gate dielectrics by controlled addition of Al2O3 using atomic layer deposition

Hao Gong, Alex See, Martin L. Green, 2002 .

Multiple-pulse laser annealing of preamorphized silicon for ultrashallow boron junction formation

Yongfeng Lu, Byung Jin Cho, Mousumi Bhat, 2003 .