M. Aoulaiche
发表
A. Vandooren,
R. Rooyackers,
E. Simoen,
2015,
2015 30th Symposium on Microelectronics Technology and Devices (SBMicro).
E. Simoen,
C. Claeys,
A. Veloso,
2012,
2012 IEEE International SOI Conference (SOI).
A. Mercha,
E. Simoen,
N. Collaert,
2010,
2010 IEEE International SOI Conference (SOI).
G. Groeseneken,
E. Simoen,
C. Claeys,
2012,
2012 IEEE International SOI Conference (SOI).
E. Simoen,
C. Claeys,
R. Ritzenthaler,
2015,
2015 International Conference on Noise and Fluctuations (ICNF).
C. Ortolland,
N. Horiguchi,
M. Aoulaiche,
2009,
IEEE Transactions on Electron Devices.
G. Groeseneken,
E. Simoen,
P. Blomme,
2012,
IEEE Transactions on Electron Devices.
E. Simoen,
C. Claeys,
A. Veloso,
2012,
IEEE Electron Device Letters.
N. Collaert,
J. Van Houdt,
M. Jurczak,
2009,
IEEE Electron Device Letters.
E. Simoen,
C. Claeys,
R. Carin,
2015,
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.
J. G. Fossum,
N. Collaert,
M. Jurczak,
2010,
2010 International Electron Devices Meeting.
L. Pantisano,
B. Kaczer,
H. Tigelaar,
2007,
2007 IEEE Symposium on VLSI Technology.
E. Simoen,
C. Claeys,
J. A. Martino,
2015,
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.
C. Ortolland,
T. Chiarella,
W. Vandervorst,
2008,
2008 Symposium on VLSI Technology.
A. Akheyar,
T. Chiarella,
C. Vrancken,
2008,
2008 Symposium on VLSI Technology.
E. Simoen,
C. Claeys,
T. Nicoletti,
2013,
IEEE Transactions on Electron Devices.
E. Simoen,
C. Claeys,
M. G. C. de Andrade,
2012,
IEEE Transactions on Electron Devices.
R. Degraeve,
G. Groeseneken,
S. Biesemans,
2009,
2009 IEEE International Reliability Physics Symposium.
B. Kaczer,
J. Mitard,
G. Groeseneken,
2013,
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2011,
IEEE Transactions on Electron Devices.
S. De Gendt,
G. Groeseneken,
M. Houssa,
2007,
IEEE Transactions on Device and Materials Reliability.
C. Ortolland,
A. Akheyar,
T. Chiarella,
2006,
2009 Symposium on VLSI Technology.
E. Simoen,
C. Claeys,
R. Carin,
2015,
2015 International Conference on Noise and Fluctuations (ICNF).
E. Simoen,
R. Ritzenthaler,
N. Horiguchi,
2014,
2014 IEEE International Electron Devices Meeting.
B. L. Bhuva,
N. N. Mahatme,
E. Simoen,
2012,
IEEE Transactions on Nuclear Science.
R. Degraeve,
B. Kaczer,
G. Groeseneken,
2012,
IEEE Transactions on Electron Devices.
L. Pantisano,
R. Degraeve,
A. Paccagnella,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
R. Degraeve,
B. Kaczer,
A. Akheyar,
2009,
2009 IEEE International Reliability Physics Symposium.