J. Y. Seo

PMOSFET anti-fuse using GIDL-induced-HEIP mechanism

W. S. Kim, J. Y. Seo, J. E. Seok, 2010, Microelectron. Reliab..

Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics

S. Y. Lee, J. Y. Seo, K. J. Lee, 2005, Microelectron. Reliab..

Reliability for Recessed Channel Structure n-MOSFET

S. Y. Lee, J. Y. Seo, K. J. Lee, 2005, Microelectron. Reliab..