Freddy Forero

Modeling and Detectability of Full Open Gate Defects in FinFET Technology

Victor Champac, Michel Renovell, Hector Villacorta, 2019, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage

Víctor H. Champac, Andres F. Gomez, Freddy Forero, 2016, 2016 17th Latin-American Test Symposium (LATS).

Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection

Víctor H. Champac, Kaushik Roy, Andres F. Gomez, 2018, VLSI-SoC.

Detectability Challenges of Bridge Defects in FinFET Based Logic Cells

Jean Marc Gallière, Michel Renovell, Víctor H. Champac, 2018, Journal of electronic testing.

Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations

Víctor H. Champac, Kaushik Roy, Andres F. Gomez, 2018, 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC).

B-open: A New Defect in Nanometer Technologies due to SADP Process

Victor Champac, Michel Renovell, Freddy Forero, 2019, 2019 IEEE European Test Symposium (ETS).

A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells

Jean Marc Gallière, Michel Renovell, Víctor H. Champac, 2019, 2019 IEEE Latin American Test Symposium (LATS).

Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage

Víctor H. Champac, Andres F. Gomez, Freddy Forero, 2016, J. Low Power Electron..

Analysis of short defects in FinFET based logic cells

Jean Marc Gallière, Michel Renovell, Víctor H. Champac, 2017, Latin American Test Symposium.