H.S. Kim

2-dimensional InGaAs/InP photodiode arrays on semi-insulating InP for laser radar and dark current characteristics

Eun Soo Nam, H.S. Kim, M.S. Oh, 2005, 2005 Asia-Pacific Microwave Conference Proceedings.

TID and SEE Response of an Advanced Samsung 4Gb NAND Flash Memory

H.S. Kim, M.D. Berg, J.W. Howard, 2007, 2007 IEEE Radiation Effects Data Workshop.

Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA

H.S. Kim, M. Friendlich, C. Poivey, 2006, 2006 IEEE Radiation Effects Data Workshop.

The impact of system configuration on device radiation damage testing of optical components

H.S. Kim, J.W. Howard, R.A. Reed, 2003, Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003..

Single event effects results for candidate spacecraft electronics for NASA

H.S. Kim, C. Poivey, J.W. Howard, 2003, 2003 IEEE Radiation Effects Data Workshop.

Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

H.S. Kim, J.W. Howard, A.B. Sanders, 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

Total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

H.S. Kim, C. Poivey, J.W. Howard, 2003, 2003 IEEE Radiation Effects Data Workshop.

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

H.S. Kim, J.D. Black, A.D. Tipton, 2008, IEEE Transactions on Nuclear Science.

The Effects of Elevated Temperature on Pulsed-Laser-Induced Single Event Transients in Analog Devices

H.S. Kim, Dakai Chen, D. McMorrow, 2009, IEEE Transactions on Nuclear Science.

TID and SEE Response of Optek Hall Effect Sensors

H.S. Kim, A.B. Sanders, A. Phan, 2008, 2008 IEEE Radiation Effects Data Workshop.

Radiation damage and single event effect results for candidate spacecraft electronics

H.S. Kim, K. Sahu, J.W. Howard, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

A compendium of recent optocoupler radiation test data

H.S. Kim, S. Crain, J.W. Howard, 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

H.S. Kim, M. Friendlich, C. Seidleck, 2006, IEEE Transactions on Nuclear Science.