M. Mahadevan

Simulations of an electromigration-induced edge instability in single-crystal metal lines

J. Debierre, Bradley Rm, M. Mahadevan, 1999 .

STABILITY OF A CIRCULAR VOID IN A PASSIVATED, CURRENT-CARRYING METAL FILM

R. M. Bradley, Mohan Mahadevan, R. Mark Bradley, 1996 .

SIMULATIONS AND THEORY OF ELECTROMIGRATION-INDUCED SLIT FORMATION IN UNPASSIVATED SINGLE-CRYSTAL METAL LINES

R. M. Bradley, Mohan Mahadevan, R. Mark Bradley, 1999 .

Phase field model of surface electromigration in single crystal metal thin films

R. M. Bradley, Mohan Mahadevan, R. Mark Bradley, 1999 .