Michiel Vandemaele
发表
Michiel Vandemaele,
M. Vandemaele,
2015
.
Dimitri Linten,
Geert Hellings,
Ben Kaczer,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Geert Hellings,
Ben Kaczer,
2019,
ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC).
Dimitri Linten,
Geert Hellings,
Tibor Grasser,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Ben Kaczer,
Erik Bury,
Michiel Vandemaele,
2020,
2020 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Guido Groeseneken,
Ben Kaczer,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
The properties, effect and extraction of localized defect profiles from degraded FET characteristics
Guido Groeseneken,
Jacopo Franco,
Ben Kaczer,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Philippe Roussel,
Guido Groeseneken,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2021,
2021 IEEE International Reliability Physics Symposium (IRPS).
Dimitri Linten,
Jacopo Franco,
Ben Kaczer,
2019
.
Dimitri Linten,
Guido Groeseneken,
Ben Kaczer,
2018,
2018 International Integrated Reliability Workshop (IIRW).
Dimitri Linten,
Geert Hellings,
Philippe Roussel,
2019,
IEEE Electron Device Letters.