B. Koenemann

A Smart BIST Variant Guaranteed Encoding

B. Koenemann, 2001 .

Built-In Self-Test (BIST) in the era of deep sub-micron technology

S. Pateras, B. Koenemann, B. Koenemann, 1996, IEEE Technical Applications Conference. Northcon/96. Conference Record.

Guaranteeing quality throughout the product life cycle: on-line test and repair to the rescue

B. Koenemann, B. Bottoms, L. Spainhower, 2001 .

Built-in logic block observation techniques

B. Koenemann, B. Koenemann, 1979 .

LFSR-coded test patterns for scan designs

B. Koenemann, 1991 .