J. Diaz-Fortuny
发表
R. Degraeve,
B. Kaczer,
E. Bury,
2022,
2022 IEEE International Reliability Physics Symposium (IRPS).
M. Nafría,
X. Aymerich,
R. Rodríguez,
2016,
The Review of scientific instruments.
A. Chasin,
B. Kaczer,
E. Bury,
2021,
Advanced Functional Materials.
Francisco V. Fernández,
Montserrat Nafría,
R. Castro-López,
2018,
2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS).
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
B. Kaczer,
J. Franco,
E. Bury,
2023,
IEEE Transactions on Device and Materials Reliability.
A. Chasin,
D. Linten,
B. Kaczer,
2021,
Advanced Electronic Materials.
H. Mertens,
R. Ritzenthaler,
A. Chasin,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
F. Fernández,
R. Castro-López,
E. Roca,
2022,
IEEE International Reliability Physics Symposium.
Francisco V. Fernández,
Javier Martin-Martinez,
Elisenda Roca,
2020,
Integr..
Javier Martin-Martinez,
Elisenda Roca,
Javier Diaz-Fortuny,
2020,
IEEE Transactions on Instrumentation and Measurement.
Rafael Castro-Lopez,
Javier Martin-Martinez,
Xavier Aragones,
2019,
IEEE Journal of Solid-State Circuits.
Francisco V. Fernández,
Montserrat Nafría,
R. Castro-López,
2018,
2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).