P. Newman

μRNG: A 300–950mV 323Gbps/W all-digital full-entropy true random number generator in 14nm FinFET CMOS

Sanu Mathew, Sudhir Satpathy, Vikram Suresh, 2015, ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC).

High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology

S. Natarajan, M. D. Giles, S. Mudanai, 2015, 2015 Symposium on VLSI Technology (VLSI Technology).

GaAs FET device and circuit simulation in SPICE

R.A. Pucel, H.A. Haus, H. Statz, 1987, IEEE Transactions on Electron Devices.

$\mu $ RNG: A 300–950 mV, 323 Gbps/W All-Digital Full-Entropy True Random Number Generator in 14 nm FinFET CMOS

Vikram Suresh, Himanshu Kaul, Amit Agarwal, 2016, IEEE Journal of Solid-State Circuits.