A. Benvenuti

Data regeneration and disturb immunity of T-RAM cells

Andrea L. Lacaita, Paolo Fantini, Christian Monzio Compagnoni, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Anomalous gate oxide conduction on isolation edges: analysis and process optimization

G. Ghidini, D. Brazzelli, A. Benvenuti, 2003, Microelectron. Reliab..

High Ion/Ioff ratio BJT selector for 32 cell string Resistive RAM arrays

A. Benvenuti, C. Cupeta, S. Lavizzari, 2014, 2014 44th European Solid State Device Research Conference (ESSDERC).

Holding voltage investigation of advanced SCR-based protection structures for CMOS technology

Fabio Alessio Marino, Gaudenzio Meneghesso, Enrico Zanoni, 2007, Microelectron. Reliab..