Xiaohui Lin
发表
Ka Nang Leung,
Yanqi Zheng,
Yong Zhou,
2020,
Int. J. Circuit Theory Appl..
Process, reliability test, and interfacial characterization for low temperature wafer direct bonding
Tielin Shi,
Zirong Tang,
Xiaohui Lin,
2007,
International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT).
Da-Wen Sun,
Xiaohui Lin,
Xiaohui Lin,
2020,
Defense + Commercial Sensing.