K. Doong
发表
Mong-Song Liang,
K.Y.-Y. Doong,
L. J. Hung,
2006,
SPIE Advanced Lithography.
C. Chiu,
J. Shih,
L. Chu,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
S. C. Lin,
K. L. Young,
K.Y.Y. Doong,
2003,
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
Andrzej J. Strojwas,
Dennis Ciplickas,
Kelvin Doong,
2019,
2019 Electron Devices Technology and Manufacturing Conference (EDTM).
Ming-Jer Chen,
Yi-Ming Sheu,
Carlos H. Diaz,
2003,
International Conference on Microelectronic Test Structures, 2003..