R. Meyer

Electrical properties of W/Si interfaces with embedded Ge/Si islands

C. Clerc, V. Yam, D. Bouchier, 2003 .

Infrared spectroscopy of oxide layers on technical Si wafers

M. Offenberg, B. Harbecke, B. Heinz, 1986 .

Effect of Ge-dots buried below the interface on the transport properties of Schottky diodes

C. Clerc, V. Yam, D. Bouchier, 2003 .

Simultaneous resistance and capacitance cartography by conducting probe atomic force microscopy in contact mode

P. Chrétien, F. Houzé, O. Schneegans, 2005 .

Surface investigations of bonded perfluoro polyether monolayers on gold surfaces

S. Noël, D. Alamarguy, O. Schneegans, 2004 .

Study of the local electrical properties of metal surfaces using an AFM with a conducting probe

R. Meyer, O. Schneegans, L. Boyer, 1996, Electrical Contacts - 1996. Proceedings of the Forty-Second IEEE Holm Conference on Electrical Contacts. Joint with the 18th International Conference on Electrical Contacts.

A Coupled-Field Simulation of an Electrical Contact during Resistance Welding

P. Teste, R. Meyer, A. Monnier, 2006, Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts.

Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

F. Houzé, O. Schneegans, L. Boyer, 1996 .

Copper sample analyzed with an n-doped silicon tip using conducting probe atomic force microscopy

P. Chrétien, F. Houzé, O. Schneegans, 2002 .

Capacitance measurements on small parallel plate capacitors using nanoscale impedance microscopy

P. Chrétien, F. Houzé, O. Schneegans, 2007 .

Response to “Comment on ‘Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes’ ” [Appl. Phys. Lett. 70, 3618 (1996)]

F. Houzé, O. Schneegans, L. Boyer, 1997 .

A Mechanical, Electrical, Thermal Coupled-Field Simulation of a Sphere-Plane Electrical Contact

B. Froidurot, P. Teste, P. Teste, 2005, IEEE Transactions on Components and Packaging Technologies.