K. Xie

The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers

R. A. Miller, T. P. Weihs, D. Zhu, 1998, 1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145).

The Reliability of Ni Contacts to n ‐ SiC Subjected to Pulsed Thermal Fatigue

R. A. Miller, D. Zhu, M. Cole, 1999 .

Macrocycle Self-Assembly Hydrogel for High-Efficient Oil-Water Separation.

B. Cheng, Guangzhao Li, Xuemei Zhao, 2023, Small.