Y. Qiu
发表
Ke Xu,
X. Su,
Jincheng Zhang,
2016
.
D. Wang,
G. Qin,
L. Fang,
2019,
Journal of Materials Science: Materials in Electronics.
Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction
Y. Qiu,
H. Yang,
Xiahe Huang,
2009
.