T. Ong

Electrical and Structural Properties of Rapid Thermal Annealed Amorphous Silicon Carbide Films

F. C. Loh, W. K. Choi, T. Ong, 1998 .

Infra-red, X-ray photoelectron spectroscopy and electrical studies of r.f. sputtered amorphous silicon carbide films

F. C. Loh, W. K. Choi, L. Tan, 1999 .

Infrared and x-ray photoelectron spectroscopy studies of as-prepared and furnace-annealed radio-frequency sputtered amorphous silicon carbide films

F. C. Loh, Leng Seow Tan, T. Y. Ong, 1998 .