F. Swartjes

Laser grooving of semiconductor wafers: Comparing a simplified numerical approach with experiments

M. van Soestbergen, J. Janssen, J. Zaal, 2015, 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.

Crystallization in isotactic polypropylene melts during contraction flow: time-resolved synchrotron WAXD studies

G. Peters, H. Meijer, U. Göschel, 2000 .

A Recoverable Strain based Model for Flow-induced Crystallization

H. Meijer, G. Peters, F. Swartjes, 2002 .

Reliability of Wafer Level Chip Scale Packages

Kirsten Weide-Zaage, R. Roucou, R. T. H. Rongen, 2014, Microelectron. Reliab..

Combination of Bayesian networks and FEM models to predict reliability of LED systems

J. E. Bullema, R. J. Werkhoven, A. W. J. Gielen, 2012, 2012 4th Electronic System-Integration Technology Conference.