C. Jansson

发表

Accuracy of the Tougaard method for quantitative surface analysis. Comparison of the Universal and REELS inelastic cross sections

F. Yubero, S. Tougaard, H. S. Hansen, 1992 .

Comparison of validity and consistency of methods for quantitative XPS peak analysis

S. Tougaard, C. Jansson, 1993 .

Intercomparison of algorithms for background correction in XPS

C. Malitesta, L. Sabbatini, B. Meenan, 1995 .

Validity of the method for quantitative XPS of surface nano-structures: application to Cu/Au/Cu

F. Yubero, D. Batchelor, S. Tougaard, 1995 .

Background correction in XPS: Comparison of validity of different methods

S. Tougaard, C. Jansson, 1992 .

Validity of background correction algorithms studied by comparison with theory of synchrotron-radiation-excited core levels and their corresponding Auger Peak intensities

S. Tougaard, C. Jung, H. S. Hansen, 1992 .

Influence of the inelastic background on the accuracy of factor analysis of electron spectra

S. Tougaard, C. Jansson, 1990 .

The stages of oxygen adsorption on polycrystalline iron studied through factor analysis applied to okll and FeM23VV d(NE)/dE auger spectra

P. Morgen, C. Jansson, 1990 .

4d-threshold effects in the elastic electron scattering spectra of lanthanum and cerium

J. N. Andersen, J. Onsgaard, C. Jansson, 1988 .

Different stages of aluminium anodization studied with depth profiling techniques

J. G. Nielsen, A. Larsen, P. Morgen, 1988 .

Factor analysis of d(NE)/dE Auger electron spectra of AuCu alloys: Surface composition during Ar+ ion bombardment and oxidation†

P. Morgen, C. Jansson, 1990 .