D. Zupac

Annealing of ESD-induced damage in power MOSFETs

peixiong zhao, K. Galloway, D. Zupac, 1993 .

Mechanisms of positive gate-bias stress induced instabilities in CMOS transistors

S. Dimitrijev, N. Stojadinovic, D. Zupac, 1987 .

Radiation‐induced mobility degradation in p‐channel double‐diffused metal‐oxide‐semiconductor power transistors at 300 and 77 K

Kenneth F. Galloway, Ronald D. Schrimpf, D. Zupac, 1993 .

Analysis of gamma-radiation induced instability mechanisms in CMOS transistors

Ninoslav Stojadinovic, Sima Dimitrijev, Momčilo M. Pejović, 1989 .

Radiation-induced mobility degradation in DMOS transistors.

D. Zupac, 1993 .

Gamma-Radiation Effects in CMOS Transistors

S. Dimitrijev, M. Pejovic, N. Stojadinovic, 1987, European Solid-State Device Research Conference.