E. Campo

Crystallization of amorphous thin low pressure chemical vapour deposition silicon films: in situ TEM measurement of grain growth rates

J. P. Guillemet, E. Scheid, B. Pieraggi, 1993 .

Influence of rapid thermal and low temperature processing on the electrical properties of polysilicon thin film transistors

J. P. Guillemet, E. Scheid, D. Bielle-daspet, 1995 .