J. Vallard

Analysis of rapid thermal annealings of boron and arsenic in polysilicon emitter structures

C. Gontrand, C. Dubois, A. Merabet, 1993 .

Quantification of germanium and boron in heterostructures Si/Si1−xGex/Si by SIMS

B. Gautier, G. Brémond, C. Dubois, 1997 .

Influence of extended defects and native impurities on external gettering in polycrystalline silicon

A. Laugier, E. Ehret, J. Vallard, 1995 .

Infrared Study of the Effect of Rapid Thermal Annealing, Thermal Donor Formation, and Hydrogen on the Precipitation of Oxygen

D. Barbier, J. Vallard, C. Maddalon‐Vinante, 1995 .