Shuang Li

Hot-Carrier degradation in P- and N-channel EDMOS for smart power application

X. Federspiel, A. Bravaix, F. Cacho, 2020 .

Multi-scale Simulation

G. Fiori, L. Leem, B. Magyari-Köpe, 2011 .

ns of Partially Unzipped CNT Hete eling Field Effect Transistor

G. Fiori, L. Leem, B. Magyari-Köpe, 2010 .