Yoshiyuki Kitahara

Reliability of NAND flash memories induced by anode hole generation in floating-gate

K. Matsuzawa, D. Hagishima, Yoshiyuki Kitahara, 2011, 2011 International Conference on Simulation of Semiconductor Processes and Devices.

Statistical study of subthreshold characteristics in polycrystalline silicon thin-film transistors

N. Sano, S. Takagi, Yoshiyuki Kitahara, 2003 .

A Theoretical Study on the Realistic Low Concentration Doping in Silicon Semiconductors by Accelerated Quantum Chemical Molecular Dynamics Method

A. Miyamoto, M. Kubo, S. Takami, 2003 .

A New Grain Boundary Model for Drift-Diffusion Device Simulations in Polycrystalline Silicon Thin-Film Transistors

N. Sano, S. Toriyama, Yoshiyuki Kitahara, 2003 .