K. Kelleher

Tantalum as a diffusion barrier between copper and silicon: Failure mechanism and effect of nitrogen additions

Karen Holloway, Peter M. Fryer, C. Cabral, 1992 .

Crystal growth and characterization of the superconducting phase in the BiSrCuO system

F. Holtzberg, P. Strobel, T. Worthington, 1988 .

Electromigration in Al/W and Al(Cu)/W Interconnect Structures

P. Ho, M. Small, C. Hu, 1991 .

Dependence of the AlxGa1−xAs band edge on alloy composition based on the absolute measurement of x

T. Kuech, D. Yan, F. Pollak, 1987 .

Dewatering Characteristics of Cambi Thermal Hydrolysis Biosolids: Centrifuges vs. BFPs

M. Higgins, S. Murthy, A. Cooper, 2011 .