A. Bezza

Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment

M. Rafik, P. Mora, X. Federspiel, 2015, 2015 IEEE International Reliability Physics Symposium.

New insight on the frequency dependence of TDDB in high-k/metal gate stacks

G. Ghibaudo, X. Federspiel, M. Rafik, 2013, IEEE International Integrated Reliability Workshop Final Report.

Frequency dependence of TDDB & PBTI with OTF monitoring methodology in high-k/metal gate stacks

G. Ghibaudo, M. Rafik, X. Federspiel, 2014, 2014 IEEE International Reliability Physics Symposium.