Jun Liu

Failure analysis and process improvement of copper diffusion

Z. Huo, Zhiliang Xia, Lu Yuan, 2019, Microelectronics Reliability.

Evaluation of emitter profiles and lateral uniformity on crystalline silicon photovoltaic cells using scanning capacitance microscopy

J. Cotte, M. Hopstaken, J. Nalaskowski, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.

Influence of BEOL process on poly-Si grain boundary traps passivation in 3D NAND flash memory

Z. Huo, Lei Jin, Jun Liu, 2019, Solid-State Electronics.