A. Konova

发表

MIS-diode as a low-energy X- and γ-ray spectrometer

A. Konova, 1979 .

Spectroscopic Ellipsometry as a Tool for Damage Profiling in Very Shallow Implanted Silicon

I. Chakarov, I. Karmakov, A. Konova, 2006 .

Cadmium tellutide etched surfaces

I. Nedev, A. Shopov, A. Konova, 1986 .

Crystalline Anodic Silicon Dioxide on Silicon

A. Konova, M. Michailov, 1978, December 16.

Depth profile characterization of low-energy B+- and Ge+-ion-implanted Si

I. Chakarov, I. Karmakov, A. Konova, 2003 .

Depth profiling of inhomogeneous layers by ellipsometry

A. Konova, D. Tonova, 1996 .

Characterization of inhomogeneous dielectric coatings with arbitrary refractive index profiles by multiple angle of incidence ellipsometry

Diana A. Tonova, Anka A. Konova, A. Konova, 2001 .

Damage depth profiles of shallow-implanted or compositional-graded surfaces for X-ray and γ-ray detectors

A. Konova, D. Tonova, J. Karmakov, 1996 .

Determination of the optical constants of substrates by angle-of-incidence derivative ellipsometry in the presence of unknown surface overlayers.

A. Konova, D. Tonova, S. Arbov, 1993, Optics letters.

Damage depth profiles determination by ellipsometry : a new numerical algorithm

A. Konova, D. Tonova, 1993 .

Determination of film thickness and refractive index of films and substrates by means of angular modulation in reflection

M. Borissov, A. Konova, K. Daskalov, 1975 .