T. Mikolajick
发表
M. Trentzsch,
S. Flachowsky,
R. Richter,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
M. Specht,
T. Mikolajick,
K.-H. Kuesters,
2006,
2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings.
Reliability Characteristics of Ferroelectric $ \hbox{Si:HfO}_{2}$ Thin Films for Memory Applications
T. Mikolajick,
S. Mueller,
J. Muller,
2013,
IEEE Transactions on Device and Materials Reliability.
Bernd Meinerzhagen,
T. Mikolajick,
G. Tempel,
2006
.
H. Mulaosmanovic,
S. Müller,
S. Slesazeck,
2017,
2017 Symposium on VLSI Technology.
A. Ascoli,
R. Tetzlaff,
S. Slesazeck,
2014,
2014 14th International Workshop on Cellular Nanoscale Networks and their Applications (CNNA).
S. Slesazeck,
J. Ocker,
T. Mikolajick,
2013,
2013 International Semiconductor Conference Dresden - Grenoble (ISCDG).
M. Strassburg,
J. Deppe,
N. Nagel,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
T. Mikolajick,
M. Schuster,
S. Lutgen,
2013,
2013 International Semiconductor Conference Dresden - Grenoble (ISCDG).
S. Riedel,
K.-H. Kusters,
A. Shappir,
2007,
2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
S. Slesazeck,
T. Mikolajick,
M. Hoffmann,
2018,
2018 76th Device Research Conference (DRC).
M. Trentzsch,
S. Flachowsky,
H. Mulaosmanovic,
2016,
2016 16th Non-Volatile Memory Technology Symposium (NVMTS).
HfO2-Based Ferroelectric Field-Effect Transistors with 260 nm Channel Length and Long Data Retention
R. Hoffmann,
M. Trentzsch,
S. Slesazeck,
2012,
2012 4th IEEE International Memory Workshop.
H. Mulaosmanovic,
S. Slesazeck,
T. Mikolajick,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
T. Mikolajick,
T. Mikolajick,
H. Ryssel,
1993
.
T. Mikolajick,
T. Mikolajick,
2002
.
M. Trentzsch,
H. Mulaosmanovic,
S. Slesazeck,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
R. Hoffmann,
T. Mikolajick,
L. Frey,
2012,
IEEE Electron Device Letters.
S. Flachowsky,
H. Mulaosmanovic,
S. Slesazeck,
2015,
2015 IEEE International Electron Devices Meeting (IEDM).
T. Mikolajick,
V. Häublein,
T. Mikolajick,
1997
.
T. Mikolajick,
J. Heitmann,
T. Hecht,
2013,
IEEE Transactions on Semiconductor Manufacturing.
S. Slesazeck,
T. Mikolajick,
U. Schroeder,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
S. Flachowsky,
S. Slesazeck,
P. Polakowski,
2015,
2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM).