T. Scott

Electrical Characterization of VLSI RAMs and PROMs.

T. Barr, T. Hoang, R. Moyers, 1987 .

Current radiation issues for programmable elements and devices

R. Katz, Robert A. Reed, B. Cronquist, 1998 .

Building envelope thermal anomaly analysis

K. W. Childs, B. S. Melton, T. Scott, 1987 .

A Diagnostic Expert System Embedded In A Portable Vibration Analysis Instrument

S. McMahon, T. Scott, R. Milne, 1991 .

QML qualified 256 K radiation-hardened CMOS SRAM

T. Scott, R. Brown, J. Damato, 1992, Workshop Record 1992 IEEE Radiation Effects Data Workshop.

Application of a pulsed laser for evaluation and optimization of SEU-hard designs [CMOS]

T. Scott, Dale McMorrow, Nadim F. Haddad, 1999 .

SEU immunity: The effects of scaling on the peripheral circuits of SRAMs

S. Doyle, D. Jallice, T. Scott, 1994 .

Fully-depleted submicron SOI for radiation hardened applications

T. Scott, Nadim F. Haddad, R. Brown, 1994 .

Application of a pulsed laser for evaluation and optimization of SEU-hard designs

T. Scott, D. McMorrow, S. Buchner, 1999, 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471).