K. Imai

Statistical Analysis of Electrical Breakdown in a Micro Gap Using Weibull Distribution and Discussion on its Processes in High Voltage

K. Imai, 2004 .

Electrical tree at high temperature in XLPE and effect of oxygen

M. Nawata, Noriyuki Shimizu, Y. Shibata, 2000, 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.00CH37132).

[Quantitative Evaluation of Metal Artifacts on CT Images on the Basis of Statistics of Extremes].

Yoshifumi Ono, Naomi Hashimoto, Suguru Ueda, 2016, Nihon Hōshasen Gijutsu Gakkai zasshi.